Equipment:
Surface metrology lab
Optics lab
XCT lab
Taylor Hobson white light interferometer
Zeiss Micro XCT
Alicona focus variation
Bruker AFM
Scientific focus and expertise:
Optical metrology
nanophotonics
nanofabrication
Materials class:
dielectrics
(semi)conductors,
Organisation:
Academia
Special Interest Group(s):
Active Metamaterials
Manufacturing and Scale Up
Modelling and AI-Design
Forum(s):
Horizon Scanning and Disruptive Concepts
Industry / KTN